| |   Anodic Bonding (air, without alignment) | 
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        | Alignment type Method used to align materials to be bonded. | unaligned | 
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            | Ambient Ambient to which substrate is exposed during processing | air | 
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            | Bonded materials Pair of materials bonded by this process | silicon, Pyrex (Corning 7740), glass (Hoya) | 
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            | Pressure Pressure of process chamber during processing | 1 atm | 
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            | Wafer size |  | 
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            | Equipment | EVG 501 Bonder 
 | 
            
            
              | Equipment characteristics: | 
            | Wafer geometry Types of wafers this equipment can accept | 1-flat, 2-flat, no-flat | 
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            | Wafer holder Device that holds the wafers during processing. | metal chuck | 
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            | Wafer materials List of wafer materials this tool can accept (not list of all materials, just the wafer itself). | silicon, Pyrex (Corning 7740) | 
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            | Wafer thickness List or range of wafer thicknesses the tool can accept | 100 .. 3000 µm | 
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              | Comments: | 
            
        
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