| | on front   Optical Exposure | 
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        | Feature geometry Shape of feature with dimensions characterized by the minimum feature size | equal line space | 
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            | Field geometry Shape of field with dimensions characterized by the maximum field size | circle | 
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            | Min feature size | 2 µm | 
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            | Sides processed | either | 
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            | Wafer size |  | 
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            | Equipment | EVG 420 Aligner | 
            
            
              | Equipment characteristics: | 
            | Wafer geometry Types of wafers this equipment can accept | 1-flat, 2-flat, no-flat | 
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            | Wafer holder Device that holds the wafers during processing. | metal chuck | 
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            | Wafer materials List of wafer materials this tool can accept (not list of all materials, just the wafer itself). | quartz (single crystal), silicon on insulator, silicon, Pyrex (Corning 7740) | 
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            | Wafer thickness List or range of wafer thicknesses the tool can accept | 100 .. 3000 µm | 
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