| | on front   Microscope inspection | 
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        | Batch size | 1 | 
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            | Magnifications | 5, 10, 20, 50, 100 | 
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            | Setup time | 30 min | 
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            | Sides inspected The sides of the wafer inspected by the process | either | 
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            | Wafer size |  | 
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            | Equipment | Olympus microscope | 
            
            
              | Equipment characteristics: | 
            | Wafer geometry Types of wafers this equipment can accept | 1-flat, 2-flat | 
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            | Wafer holder Device that holds the wafers during processing. | plastic table | 
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            | Wafer materials List of wafer materials this tool can accept (not list of all materials, just the wafer itself). | silicon | 
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            | Wafer thickness List or range of wafer thicknesses the tool can accept | 300 .. 2500 µm | 
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              | Comments: | 
            
        
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