on front Silicon Nitride ICP Etch |
|
| Process characteristics: |
| Depth |
|
| Etch rate |
0.19 µm/min |
| Gas |
SF6, CF4, He |
| Material |
silicon nitride |
| Sides processed |
either |
| Temperature |
25 °C |
| Wafer size |
|
| Equipment |
VLR 700 Cluster - Fluorine Dielectric Etch Chamber |
| Equipment characteristics: |
| Batch sizes |
100 mm: 25 |
| Wafer geometry Types of wafers this equipment can accept |
1-flat |
| Wafer holder Device that holds the wafers during processing. |
cassette |
| Wafer materials List of wafer materials this tool can accept (not list of all materials, just the wafer itself). |
quartz (fused silica), sapphire, silicon, silicon on insulator |