| |   BCB Contact mask align and exposure | 
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        | Alignment tolerance Registration of CAD data to features on wafer | 3 µm | 
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            | Feature geometry Shape of feature with dimensions characterized by the minimum feature size | crosshair | 
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            | Field geometry Shape of field with dimensions characterized by the maximum field size | square | 
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            | Min feature size | 35 µm | 
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            | Wafer size |  | 
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            | Equipment | Suss Microtec Contact aligner | 
            
            
              | Equipment characteristics: | 
            | Batch sizes | 100 mm: 1, 125 mm: 1, 150 mm: 1 | 
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            | MOS clean | no | 
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            | Wafer geometry Types of wafers this equipment can accept | 1-flat, 2-flat, no-flat, notched | 
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            | Wafer holder Device that holds the wafers during processing. | vacuum chuck | 
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            | Wafer materials List of wafer materials this tool can accept (not list of all materials, just the wafer itself). | alumina, BK7, Borofloat (Schott), ceramic, copper, Corning 1737, Foturan (Schott), fused silica, gallium arsenide, gallium phosphide, germanium, glass (Hoya), glass-ceramic, indium phosphide, lithium niobate, other, Pyrex (Corning 7740), quartz (fused silica), quartz (single crystal), sapphire, silicon, silicon carbide, silicon germanium, silicon on insulator, silicon on sapphire, titanium | 
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            | Wafer thickness List or range of wafer thicknesses the tool can accept | 200 .. 1000 µm | 
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